System on Chip Test Architectures Book

System on Chip Test Architectures


  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Release Date : 2010-07-28
  • Genre: Technology & Engineering
  • Pages : 896
  • ISBN 10 : 0080556809
  • Total Read : 81
  • File Size : 15,9 Mb

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System on Chip Test Architectures Summary:

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

System on chip Test Architectures Book
Score: 4
From 1 Ratings

System on chip Test Architectures


  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Release Date : 2008
  • Genre: Computers
  • Pages : 856
  • ISBN 10 : 9780123739735
  • Total Read : 62
  • File Size : 7,6 Mb

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System on chip Test Architectures Summary:

Written by a stellar team of field experts, this title is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that allow VSLI designers, DFT practitioners, and students to master quickly System-on-Chip Test architectures, memory, and analog/mixed-signal designs.

Introduction to Advanced System on Chip Test Design and Optimization Book
Score: 3
From 1 Ratings

Introduction to Advanced System on Chip Test Design and Optimization


  • Author : Erik Larsson
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-03-30
  • Genre: Technology & Engineering
  • Pages : 388
  • ISBN 10 : 9780387256245
  • Total Read : 90
  • File Size : 7,6 Mb

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Introduction to Advanced System on Chip Test Design and Optimization Summary:

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Design and Test Technology for Dependable Systems on chip Book

Design and Test Technology for Dependable Systems on chip


  • Author : Raimund Ubar
  • Publisher : IGI Global
  • Release Date : 2011-01-01
  • Genre: Computers
  • Pages : 550
  • ISBN 10 : 9781609602147
  • Total Read : 79
  • File Size : 6,6 Mb

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Design and Test Technology for Dependable Systems on chip Summary:

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

System on Chip Book

System on Chip


  • Author : Bashir M. Al-Hashimi
  • Publisher : IET
  • Release Date : 2006-01-31
  • Genre: Computers
  • Pages : 940
  • ISBN 10 : 9780863415524
  • Total Read : 94
  • File Size : 16,6 Mb

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System on Chip Summary:

This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

VLSI SOC  From Systems to Chips Book

VLSI SOC From Systems to Chips


  • Author : Manfred Glesner
  • Publisher : Springer
  • Release Date : 2006-08-16
  • Genre: Computers
  • Pages : 314
  • ISBN 10 : 9780387334035
  • Total Read : 74
  • File Size : 19,6 Mb

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VLSI SOC From Systems to Chips Summary:

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10 Working Group 10.5, is to provide a forum to exchange ideas and show research results in the field of microelectronics design. The current trend toward increasing chip integration brings about exhilarating new challenges both at the physical and system-design levels: this conference aims to address these exciting new issues. The 2003 edition of VLSI-SoC conserved the traditional structure, which has been successful in previous editions. The quality of submissions (142 papers) made the selection process difficult, but finally 57 papers and 14 posters were accepted for presentation in VLSI-SoC 2003. Submissions came from Austria, Bulgaria, Brazil, Canada, Egypt, England, Estonia, Finland, France, Germany, Greece, Hungary, India, Iran, Israel, Italy, Japan, Korea, Malaysia, Mexico, Netherlands, Poland, Portugal, Romania, Spain, Sweden, Taiwan and the United States of America. From 57 papers presented at the conference, 18 were selected to have an extended and revised version included in this book.

SOC  System on a Chip  Testing for Plug and Play Test Automation Book

SOC System on a Chip Testing for Plug and Play Test Automation


  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-04-17
  • Genre: Technology & Engineering
  • Pages : 200
  • ISBN 10 : 9781475765274
  • Total Read : 89
  • File Size : 15,6 Mb

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SOC System on a Chip Testing for Plug and Play Test Automation Summary:

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.

Advances in Electronic Testing Book

Advances in Electronic Testing


  • Author : Dimitris Gizopoulos
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-01-22
  • Genre: Technology & Engineering
  • Pages : 412
  • ISBN 10 : 9780387294094
  • Total Read : 73
  • File Size : 16,9 Mb

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Advances in Electronic Testing Summary:

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.