Scanning Nonlinear Dielectric Microscopy Book

Scanning Nonlinear Dielectric Microscopy


  • Author : Yasuo Cho
  • Publisher : Woodhead Publishing
  • Release Date : 2020-05-20
  • Genre: Technology & Engineering
  • Pages : 256
  • ISBN 10 : 9780081028032
  • Total Read : 86
  • File Size : 8,7 Mb

DOWNLOAD BOOK
Scanning Nonlinear Dielectric Microscopy Summary:

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Scanning Nonlinear Dielectric Microscopy Book

Scanning Nonlinear Dielectric Microscopy


  • Author : Yasuo Cho
  • Publisher : Woodhead Publishing
  • Release Date : 2020-06-04
  • Genre: Technology & Engineering
  • Pages : 256
  • ISBN 10 : 9780128172469
  • Total Read : 67
  • File Size : 10,8 Mb

DOWNLOAD BOOK
Scanning Nonlinear Dielectric Microscopy Summary:

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Nanoscale Characterisation of Ferroelectric Materials Book

Nanoscale Characterisation of Ferroelectric Materials


  • Author : Marin Alexe
  • Publisher : Springer Science & Business Media
  • Release Date : 2013-03-09
  • Genre: Science
  • Pages : 282
  • ISBN 10 : 9783662089019
  • Total Read : 94
  • File Size : 13,6 Mb

DOWNLOAD BOOK
Nanoscale Characterisation of Ferroelectric Materials Summary:

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.

Scanning Probe Microscopy  Characterization  Nanofabrication and Device Application of Functional Materials Book

Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials


  • Author : Paula M. Vilarinho
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-03-30
  • Genre: Science
  • Pages : 488
  • ISBN 10 : 9781402030192
  • Total Read : 60
  • File Size : 7,8 Mb

DOWNLOAD BOOK
Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials Summary:

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.

Roadmap of Scanning Probe Microscopy Book
Score: 5
From 1 Ratings

Roadmap of Scanning Probe Microscopy


  • Author : Seizo Morita
  • Publisher : Springer Science & Business Media
  • Release Date : 2006-12-30
  • Genre: Technology & Engineering
  • Pages : 201
  • ISBN 10 : 9783540343158
  • Total Read : 76
  • File Size : 11,6 Mb

DOWNLOAD BOOK
Roadmap of Scanning Probe Microscopy Summary:

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Innovative Graphene Technologies Book
Score: 5
From 1 Ratings

Innovative Graphene Technologies


  • Author : Atul Tiwari
  • Publisher : Smithers Rapra
  • Release Date : 2013-09-02
  • Genre: Science
  • Pages : 564
  • ISBN 10 : 9781909030237
  • Total Read : 78
  • File Size : 11,7 Mb

DOWNLOAD BOOK
Innovative Graphene Technologies Summary:

Graphene has already gained a unique reputation among novel synthetic materials. Dedicated efforts and enormous resources are being invested in creating viable commercial products. The high electrical and thermal conductivities in graphene are well known, and most of the applications of this material are pivoted to these properties. In addition to electronic and thermal management applications there are several other vital areas where graphene can be used successfully. This book is compiled in two volumes. Volume 1 is specifically meant for beginners who want to know the science and technology associated with this nanomaterial. This volume consists of chapters that are specifically written for readers who are looking for the applications of graphene and its derivatives. The first objective of this book is to provide readers with numerical/physics based models for assessment of graphene for targeted applications. The second objective of this book is to introduce readers to the industrial applications of graphene. Chapters are carefully written so that readers can choose methodologies for screening of graphene materials for a particular application. This second volume is written for broader readership including young scholars and researchers with diverse backgrounds such as chemistry, physics, materials science, and engineering. It can be used as a textbook for graduate students, and also as a review or reference book for researchers from different branches of materials science.

Applied Scanning Probe Methods X Book

Applied Scanning Probe Methods X


  • Author : Bharat Bhushan
  • Publisher : Springer Science & Business Media
  • Release Date : 2007-12-20
  • Genre: Technology & Engineering
  • Pages : 427
  • ISBN 10 : 9783540740858
  • Total Read : 74
  • File Size : 11,8 Mb

DOWNLOAD BOOK
Applied Scanning Probe Methods X Summary:

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Measurement Techniques for Radio Frequency Nanoelectronics Book

Measurement Techniques for Radio Frequency Nanoelectronics


  • Author : T. Mitch Wallis
  • Publisher : Cambridge University Press
  • Release Date : 2017-09-14
  • Genre: Science
  • Pages : 329
  • ISBN 10 : 9781107120686
  • Total Read : 60
  • File Size : 15,9 Mb

DOWNLOAD BOOK
Measurement Techniques for Radio Frequency Nanoelectronics Summary:

Featuring numerous examples linking theoretical concepts with real-world applications, this practical, cross-disciplinary guide will help you understand the fundamentals of radio frequency measurement of nanoscale devices. -- Résumé abrégé du livre.